Detecting sub-5nm defects creates huge challenges for chipmakers, challenges that have a direct impact on yield, reliability, and profitability. In addition to being smaller and harder to detect, ...

In response to the current issue of insufficient multi-scale defect coverage capability in detection networks,we propose a multi-scale fusion MobileMamba network by optimizing the model’s backbone ...

Whether the discussion is about smart manufacturing or digital transformation, one of the biggest conversations in the semiconductor industry today centers on the tremendous amount of data fabs ...

Detecting surface flaws in steel is vital for ensuring structural safety and maintaining product quality, both of which have direct implications for manufacturing efficiency. In the early stages of ...