Memory test at-speed isn�t easy but can be achieved by balancing test selection, area overhead, and test-time constraints. The semiconductor industry has intensified its focus on yield issues to ...

Design-for-test, or DFT, should facilitate high-quality test, not change the design. Test techniques and strategies need to supply a high-quality test that screens out defective devices, avoiding ...

Apple is said to be working on its smart glasses, unofficially called the "Apple Glasses," and the company is reportedly testing at least four designs for the new wearable, according to an analyst.

Scaling to tens of millions of CPO units per year requires the industry to first settle on automated, cost-effective methods ...

When semiconductor devices had geometries of 0.18 microns and larger, most defects manifested themselves as static faults. Test strategies based on stuck-at fault-model scan patterns and standard ...

The advent of delivering 10 Gigabit Ethernet connections to the enterprise and data center opens up a myriad of test challenges. Constructing a comprehensive and standards-based test environment is ...

Join us as we put 15 different Lego propellers to the test in this fun and informative video! We explore how each propeller design performs in terms of speed, power, and efficiency, comparing their ...